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Results 1 to 25 of 43

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INTRODUCTION OF A CALIBRATION LINE FOR COMPOSITION DETERMINATION OF A BINARY ALLOY BY AUGER ELECTRON SPECTROSCOPY (QUANTITATIVE FORMALISM)TOKUTAKA H; NISHIMORI K; TAKASHIMA K et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 1; PP. 202-205; BIBL. 15 REF.Article

NEW SURFACE STRUCTURE ANALYSIS OF AG-SI PHASE BY QUANTITATIVE AUGER ELECTRON SPECTROSCOPY METHODTOKUTAKA H; NISHIMORI K; NOMURA S et al.1982; SURF. SCI.; NLD; DA. 1982; VOL. 115; NO 1; PP. 79-90; BIBL. 18 REF.Article

NEW SURFACE STRUCTURE ANALYSIS OF AG-SI PHASE BY QUANTITATIVE AUGER ELECTRON SPECTROSCOPY METHODTOKUTAKA H; NISHIMORI K; NOMURA S et al.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 115; NO 1; PP. 79-90; BIBL. 18 REF.Article

APPAREIL DE REFROIDISSEMENT A AZOTE LIQUIDE POUR UN MANIPULATEUR D'ECHANTILLON D'UNE EXPERIENCE LEED-AESINOUE K; TOKUTAKA H; NISHIMORI K et al.1977; J. VACUUM SOC. JAP.; JAP.; DA. 1977; VOL. 20; NO 11; PP. 380-385; ABS. ANGL.; BIBL. 6 REF.Article

COMMENTS ON LEED OBSERVABLE VOLTAGE RANGE FROM ALKALI HALIDE (100) SURFACES.NISHIMORI K; TOKUTAKA H; ISHIHARA N et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 44; NO 2; PP. 635-637; BIBL. 4 REF.Article

DETERMINATION DU MODE DE CROISSANCE D'UNE COUCHE MINCE PAR SPECTROMETRIE AUGERKUNIKYO M; TOKUTAKA H; NISHIMORI K et al.1977; J. VACUUM SOC. JAP.; JAP.; DA. 1977; VOL. 20; NO 6; PP. 213-218; ABS. ANGL.; BIBL. 17 REF.Article

Effects of YBa2Cu3Oy doping into Bi2Sr2Ca2Cu3Ox on superconducting propertiesIMAO, H; KISHIDA, S; TOKUTAKA, H et al.Physica status solidi. A. Applied research. 1993, Vol 137, Num 1, pp 173-178, issn 0031-8965Article

Direct comparison of fine structure on Ti L3 threshold by disappearance potential and Auger electron and soft X-ray appearance potential spectroscopies = Comparaison directe de la structure fine au seuil TiL3 par spectroscopies de potentiel de disparition d'électrons Auger et de potentiel d'apparition de rayons X mousNISHIMORI, K; TOKUTAKA, H; KOHNO, M et al.Japanese journal of applied physics. 1984, Vol 23, Num 6, pp L366-L368, issn 0021-4922Article

A quantitative Auger electron spectroscopy method (applied to a thin film monolayer overgrowth) = Einsatz des quantitativen Auger-Elektronenmikroskopie-Verfahrens zur Untersuchung des Ueberwachungsverhaltens einer monomolekularen DuennschichtTOKUTAKA, H; NISHIMORI, K; TAKASHIMA, K et al.Surface science. 1983, Vol 133, Num 2/3, pp 547-579, issn 0039-6028Article

Interface reaction of Si thin film on Au substrateNISHIMORI, K; TOKUTAKA, H; SUMI, H et al.Applied surface science. 1991, Vol 47, Num 4, pp 365-369, issn 0169-4332, 5 p.Article

Scanning Auger electron microscope resolution determined by a quantitative AES methodTOKUTAKA, H; NISHIMORI, K; MATSUURA, J et al.Surface science. 1987, Vol 186, Num 3, pp 339-356, issn 0039-6028Article

COMPOSITION AND THICKNESS OF THE SURFACE SEGREGATION REGION OF A BINARY ALLOY SYSTEM DETERMINED BY A QUANTITATIVE AUGER ELECTRON SPECTROSCOPY METHOD = COMPOSITION ET EPAISSEUR DE LA REGION DE SEGREGATION DE SURFACE D'UN SYSTEME D'ALLIAGES BINAIRES DETERMINEES PAR LA METHODE DE SPECTROSCOPIE QUANTITATIVE D'ELECTRONS AUGERTOKUTAKA H; NISHIMORI K; TANAKA K et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 10; PP. 6109-6115; BIBL. 17 REF.Article

Preparation conditions of Bi-based superconducting ceramics with high critical current densityIMAO, H; KISHIDA, S; TOKUTAKA, H et al.Physica. C. Superconductivity. 1991, Vol 185/89, pp 2397-2398, issn 0921-4534, p.4Conference Paper

Effect of Bi2Sr2CaCu2Oy single crystal surfaces on contact resistanceIMAO, H; KISHIDA, S; TOKUTAKA, H et al.Japanese journal of applied physics. 1996, Vol 35, Num 10, pp 5299-5303, issn 0021-4922, 1Article

Effects of the preparation conditions ob Bi-based superconducting ceramics on superconductivityIMAO, H; KISHIDA, S; TOKUTAKA, H et al.Physica status solidi. A. Applied research. 1995, Vol 148, Num 2, pp 537-543, issn 0031-8965Article

En Japonais = Surface analysis of 80 K-phase Bi2Sr2CaCu2Oy superconducting single crystals and thin films by X-ray photoelectron spectroscopyKISHIDA, S; TOKUTAKA, H; NISHIMORI, K et al.Bunseki Kagaku. 1991, Vol 40, Num 11, pp 823-827, issn 0525-1931Article

Off-angle SiC(0001) surface and Cu/SiC interface reactionNISHIMORI, K; TOKUTAKA, H; NAKANISHI, S et al.Japanese journal of applied physics. 1989, Vol 28, Num 8, pp L1345-L1348, issn 0021-4922, 2Article

A RHEED study of the initial growth of Ag on the Si(001) surfaceNISHIMORI, K; TOKUTAKA, H; TAMON, T et al.Surface science. 1991, Vol 242, Num 1-3, pp 157-161, issn 0039-6028, 5 p.Conference Paper

LEED-AES observations of 7 K- and 80 K-phase Bi-Sr-Ca-Cu-O single crystalsKISHIDA, S; TOKUTAKA, H; FUJIMOTO, H et al.Japanese journal of applied physics. 1989, Vol 28, Num 8, pp L1389-L1392, issn 0021-4922, 2Article

Growth of Bi2Sr2CaCu2Oy single crystals using a vertical Bridgman methodTANAKA, A; KISHIDA, S; SHIBASAKI, A et al.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp L761-L763, issn 0021-4922, 2Article

Surface study of single-crystal 80 K Bi-Sr-Ca-Cu-O superconductor with Si and Nb by RHEED and XPS depth profileNISHIMORI, K; TOKUTAKA, H; TAMON, T et al.Applied surface science. 1991, Vol 48-49, pp 450-453, issn 0169-4332, 4 p.Conference Paper

Critical current as a function of temperature in superconducting single-crystal (Bi,Pb)2Sr2CaCu2OyOYA, G.-I; AOYAMA, N; KISHIDA, S et al.Physica. C. Superconductivity. 1991, Vol 185/89, pp 2453-2454, issn 0921-4534, p.4Conference Paper

The comparison of the background removal methods in XPS spectraTOKUTAKA, H; ISHIHARA, N; NISHIMORI, K et al.Japanese journal of applied physics. 1990, Vol 29, Num 11, pp 2512-2513, issn 0021-4922, 1Article

Growth of Bi2Sr2CaCu2Oy single crystals by a vertical Bridgman method and their characterizationTANAKA, A; KISHIDA, S; SHIBASAKI, A et al.Journal of crystal growth. 1997, Vol 182, Num 1-2, pp 60-64, issn 0022-0248Article

Background removal in X-ray photoelectron spectroscopyTOKUTAKA, H; ISHIHARA, N; NISHIMORI, K et al.Surface and interface analysis. 1992, Vol 18, Num 10, pp 697-704, issn 0142-2421Article

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